Meets ACCRETECH New ZEISS METROTOM 1500

ZEISS METROTOM 1500

New products

Faster, reliable measurement results with higher image quality.
Further evolution of X-ray CT enables advanced quality control.

ZEISS METROTOM 1500

Currently the most advanced X-ray CT

ZEISS METROTOM is a dimensional X-ray CT that distinguishes itself from previous observational X-ray CTs by featuring individual axis control technology nurtured with CMMs, an ultra-high-accuracy positioning stage, a high-resolution flat panel detector, and CALYPSO CT software. In addition to non-destructive inspections such as structural analysis, functional inspection, and defect analysis, ZEISS METROTOM offers many optimal solutions, from structural comparison of the internal shape of complex industrial product (e.g. resin moldings, aluminum die casts) to high-precision measurement of internal and external dimensions.

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ZEISS METROTOM 1500

Further evolution of METROTOM enables advanced quality control

ZEISS METROTOM can obtain complete volume data of workpieces non-destructively in a single scan to areas where traditional contact styluses and non-contact sensors cannot reach. Small hole diameters and narrow parts that could not be measured without cutting parts can also be probed using software. There is no longer any need to cut parts, therefore manhours are reduced accordingly. The hardware of this third generation ZEISS METROTOM 1500 has been significantly redesigned to provide clearer and faster scanned images than previous models. It is now the most advanced X-ray CT capable of detecting the internal defects that have been overlooked until now as well as the speedy non-destructive measurement of finer shapes. A further evolution, METROTOM delivers a high level of quality control in the measurement and inspection of various parts, from plastics to metals.

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さらなる進化を遂げたMETROTOMで高レベルの品質管理が可能に

Higher image quality

Equipped with a 3K detector, voxel size has been reduced by up to 54% compared to the previous model. This allows scan data to be retrieved at high resolution, even at the same magnification. By obtaining clearer image quality than before, it is now possible to measure detailed interior shapes and detect internal defects that have been overlooked until now.

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もっと高画質に

Faster

Using the binning mode, which groups together multiple pixels of a detector and considers them as a single pixel, users can scan up to four times faster with the same image quality as a traditional 2K detector. In other words, a scan that takes a 2K detector around 7 minutes can be completed in less than 2 minutes with a 3K detector. This means more tests and measurements can be performed in the same scan time.

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さらなる進化を遂げたMETROTOMで高レベルの品質管理が可能に

Reliable Measurement Results

The world's highest measurement accuracy
MPESD of 4.5 + L/50 µm (VDI/VDE 2630 sheet 1.3 compliant)
By combining ZEISS' long-cultivated measurement capabilities and knowledge, X-ray CT has evolved into a reliable measurement method with traceability. Accuracy is guaranteed in all measurement ranges, and manual calibration for each scan is not required even if workpiece position changes.

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さらなる進化を遂げたMETROTOMで高レベルの品質管理が可能に
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