ZEISS PiWeb sbs/Enterpirse
Data from multiple measurement systems is collected, stored, and managed in PiWeb server.
You can statistically analyze stored data, create graphical reports, and monitor measurement results.
Features
Storage of data from multiple measuring instruments in one database
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Integration and storage of various measurement result dataEven if different machines are used to measure differentareas of a workpiece, all measurement results can be stored and managed in the PiWeb server.
For measurement systems equipped with CALYPSO, in addition to measurement results, CALYPSO’s measurement plan and point information can also be stored in the PiWeb server. -
Support to third-party measurement instrument and manual gages*It can store data not only from measurement instrument of Carl Zeiss and Tokyo Seimitsu but also from third-party measurement instrument and manual gages such as digital calipers.
*Data from third-party measurement instrument and manual gages is supported separately.
Search refinement for measurement data stored in database with various search conditions
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Easy search for past measurement resultsEasily searching past measurement results by setting date and time, period or other items contained in the measurement data as search criteria.
No need to search pdf files and paper reports one by one.
Flexible and graphical reports
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Graphical reporting of measurement data and statistical analysisIt displays graphical reporting of results of one measurement, data from multiple measurement instruments, or statistical analysis of data during a specified period. The report template can be freely created to meet diverse needs.
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Displays measurement results on 3D CAD models or 2D drawingsIt is possible to load 3D CAD models, 2D drawings into report templates and associate with measuring data.
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Output the profile plot of measurement result of CALYPSO intuitivelyFrom CALYPSO measurement point information stored in PiWeb server, it is possible to output profile plots such as roundness, flatness, and cylindrical profile, etc., which can confirm the measurement result more intuitively.
